Machine Vision Products (MVP) — a global leader in automated optical inspection (AOI) and metrology solutions for advanced microelectronics and semiconductor manufacturing.

Whether you’re producing photonics, MEMS, ICs, or advanced packaging, MVP’s platforms deliver unmatched precision, speed, and flexibility.

High-Resolution Inspection for Complex Devices

MVP’s systems are built around proprietary algorithms and high-resolution 2D and 3D optics, enabling:

•  Sub-micron defect detection across wafers, substrates, and assemblies

•  3D metrology for height, coplanarity, and volume measurement

•  Multi-sensor fusion for hybrid inspection tasks

•  Real-time process feedback for closed-loop control

These capabilities support inspection of  and reliability.

Scalable Platforms for Every Production Stage

MVP offers a range of platforms tailored to microelectronics and semiconductor workflows